优化老化测试结果查询

diff --git a/code/sdk/application/wearable/service/factorytest_service/factorytest_protocol.c b/code/sdk/application/wearable/service/factorytest_service/factorytest_protocol.c
index fddefc0..f56c055 100644 (file)
--- a/code/sdk/application/wearable/service/factorytest_service/factorytest_protocol.c
+++ b/code/sdk/application/wearable/service/factorytest_service/factorytest_protocol.c
@@ -2,7 +2,7 @@
  * @Author: penglei 1624952103@qq.com\r
  * @Date: 2024-06-17 14:31:08\r
  * @LastEditors: penglei 1624952103@qq.com\r
- * @LastEditTime: 2024-10-31 21:19:20\r
+ * @LastEditTime: 2024-11-01 11:35:05\r
  * @FilePath: /FD230/code/sdk/application/wearable/service/factorytest_service/factorytest_protocol.c\r
  * @Description: \r
  * \r
@@ -56,22 +56,22 @@ typedef struct factorytest_cmd_header_t
 \r
 typedef struct\r
 {\r
-    uint32_t flag; //老化测试状态 (未开始 - 0, 已开始 - 1, 停止 - 2，完成 - 3)\r
-    uint32_t target_time;    //目标时间\r
-    uint32_t left_time;    //剩余时间\r
-    uint32_t executions_num;//执行次数 \r
-    uint32_t fail_num;      //总失败次数\r
-    uint32_t display_error; //LCD失败次数\r
-    uint32_t tp_error;      //tp失败次数\r
-    uint32_t crown_error;   //表冠失败次数\r
-    uint32_t gsensor_error;  //gsensor失败次数\r
-    uint32_t ppg_error;     //ppg失败次数\r
-    uint32_t mag_error;     //磁力计失败次数 \r
-    uint32_t motor_error;   //马达失败次数 \r
-    uint32_t mic_error;   //mic失败次数 \r
-    uint32_t speaker_error; //spk失败次数 \r
     uint32_t charge_error; //充电失败次数 \r
-}ble_aging_t;\r
+    uint32_t speaker_error; //spk失败次数 \r
+    uint32_t mic_error;   //mic失败次数 \r
+    uint32_t motor_error;   //马达失败次数 \r
+    uint32_t mag_error;     //磁力计失败次数 \r
+    uint32_t ppg_error;     //ppg失败次数\r
+    uint32_t gsensor_error;  //gsensor失败次数\r
+    uint32_t crown_error;   //表冠失败次数\r
+    uint32_t tp_error;      //tp失败次数\r
+    uint32_t display_error; //LCD失败次数\r
+    uint32_t fail_num;      //总失败次数\r
+    uint32_t executions_num;//执行次数 \r
+    uint32_t left_time;    //剩余时间\r
+    uint32_t target_time;    //目标时间\r
+    uint32_t flag; //老化测试状态 (未开始 - 0, 已开始 - 1, 停止 - 2，完成 - 3)\r
+} ble_aging_t;\r
 \r
 #pragma pack()\r
 \r
@@ -214,7 +214,8 @@ void aging_task(void)
                 cmd = 1;   \r
             LOS_Msleep(1000);\r
         }\r
-        \r
+        cmd = 5;\r
+        do_custom_cmd_service_check_msg(CUSTOM_CMD_MSG_TYPE_LCD_COLOR_TEST,&cmd,sizeof(cmd));\r
 /*********************TP 老化测试*****************************/\r
         //读TP ID\r
         uint16_t tp_id;\r
@@ -375,13 +376,17 @@ void aging_task(void)
         PRINT("磁力计失败次数 : %d \r\n",aging_t.mag_error);\r
 \r
         uapi_get_timestampe_ss(&current_aging_time);\r
-        aging_time = aging_t.target_time - (current_aging_time - enter_aging_time);\r
-        PRINT("aging_time : %d \r\n",aging_time);\r
         if(current_aging_time - enter_aging_time > aging_t.target_time)\r
         {\r
             aging_t.flag = 3;\r
+            aging_time = 0;\r
+            aging_t.left_time = 0;\r
+            PRINT("老化完成\n");\r
             return;\r
         }\r
+        aging_time = aging_t.target_time - (current_aging_time - enter_aging_time);\r
+        PRINT("aging_time : %d \r\n",aging_time);\r
+\r
     }\r
 }\r
 \r
@@ -916,9 +921,10 @@ void factorytest_protocol_soft_test_decode(uint8_t submode,uint8_t testitem,uint
                 //查询老化标志\r
                 uint8_t send_data[3] = {0};\r
 \r
+                send_data[1] = aging_t.flag;\r
+\r
                 if(aging_t.fail_num != 0)\r
                 {\r
-                    send_data[1] = 0xff;\r
                     send_data[2] = 0x01;\r
                 }\r
                 factorytest_protocol_replymsg(BLE_TEST_CMD_MODE_SOFT_TEST,\r
@@ -930,20 +936,27 @@ void factorytest_protocol_soft_test_decode(uint8_t submode,uint8_t testitem,uint
             } else if(testitem == 0x04)\r
             {\r
                 //查询老化结果\r
-                \r
-                uint8_t *databuf = malloc(sizeof(ble_aging_t));\r
-                uint8_t *ptr = (uint8_t *)&aging_t;\r
-                for(int i = 0; i < sizeof(ble_aging_t); i++) \r
+                int size = sizeof(ble_aging_t);\r
+                uint8_t *databuf = (uint8_t *)malloc(size);\r
+                if (databuf == NULL) \r
                 {\r
-                    *databuf++ = ptr[i];\r
+                    PRINT("malloc failed \n");\r
+                    return ;\r
                 }\r
 \r
+                uint8_t *buf = databuf;\r
+                const uint8_t *structBytes = (const uint8_t *)&aging_t;\r
+\r
+                for (int i = 0; i < size; i++) \r
+                    buf[size - 1 - i] = structBytes[i];\r
+\r
 \r
                 factorytest_protocol_replymsg(BLE_TEST_CMD_MODE_SOFT_TEST,\r
                         BLE_TEST_CMD_SOFT_TEST_SUB_MODE_AGING_TEST,\r
                         0x04,\r
                         databuf,\r
-                        sizeof(ble_aging_t));\r
+                        size);\r
+                \r
                 free(databuf);\r
             } else if(testitem == 0x05)\r
             {\r